Invention Grant
- Patent Title: Method of determining an error rate and a suitable testing device
- Patent Title (中): 确定错误率的方法和合适的测试设备
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Application No.: US11908594Application Date: 2006-03-15
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Publication No.: US09246643B2Publication Date: 2016-01-26
- Inventor: Thomas Braun , Uwe Baeder , Pirmin Seebacher
- Applicant: Thomas Braun , Uwe Baeder , Pirmin Seebacher
- Applicant Address: DE München
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE München
- Agency: Marshall, Gerstein & Borun LLP
- Priority: DE102005012978 20050321; DE102005016585 20050411
- International Application: PCT/EP2006/002368 WO 20060315
- International Announcement: WO2006/099980 WO 20060928
- Main IPC: H04W24/00
- IPC: H04W24/00 ; H04L1/20 ; H04L1/16 ; H04L1/24 ; H04B17/00 ; H04B17/24 ; H04L1/00 ; H04L1/18

Abstract:
The invention relates to a method and to a test device (12) which is used to determine an error rate during the transfer of data (1) in a mobile radio system. Said mobile radio system comprises at least one transfer channel, wherein several data partial flows (2.1, 2.2, 2.6) are transferred. The several data partial flows (2.1, 2.2 . . . 2.6) are produced in a signal generator unit (8). A transport format is determined, in an individual manner, for each data partial flow (2.1, 2.2 . . . 2.6). The data partial flows (2.1, 2.2 . . . 2.6) are sent, respectively, to a number of transfer blocks which belong together (5.1, . . . 7.1). A device which is to be tested captures the transfer blocks (5.1, . . . 7.1) of the data partial flows (2.1, 2.2 . . . 2.6) and evaluates them. According to the accuracy of the evaluation, a positive or negative actuation signal (ACK, NACK) is sent back by the device which is to be tested. An error rate of each data partial flow (2.1, 2.2 . . . 2.6) is determined by the test device (12) from the actuation signals (ACK, NACK) which are captured by the test device (12).
Public/Granted literature
- US20080214183A1 Method of Determining an Error Rate and a Suitable Testing Device Public/Granted day:2008-09-04
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