Invention Grant
- Patent Title: Surface roughness measuring unit and coordinate measuring apparatus
- Patent Title (中): 表面粗糙度测量单元和坐标测量仪
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Application No.: US14050553Application Date: 2013-10-10
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Publication No.: US09250053B2Publication Date: 2016-02-02
- Inventor: Kotaro Hirano , Nobuyuki Hama , Masanori Arai , Sadayuki Matsumiya
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2012-230818 20121018
- Main IPC: G01B5/004
- IPC: G01B5/004 ; G01B5/28 ; G01B5/012 ; G01B5/016 ; G01B7/02 ; B82Y35/00 ; G01B5/008

Abstract:
A surface roughness measuring unit according to the present invention includes a contact pin unit having a contact pin and a displacement detector, the contact pin being provided so as to project and retract through a through-hole of a skid and scanning and moving along a surface of a work piece, the displacement detector detecting displacement of the contact pin in a direction perpendicular to the work piece surface; a driver moving the contact pin unit forward and backward along the surface of the work piece; and a joint coupling the contact pin unit and the driver to a measurement head holder of a coordinate measuring system. The surface roughness measuring unit further includes a contact detector that detects contact of the skid on the surface of the work piece.
Public/Granted literature
- US20140109422A1 SURFACE ROUGHNESS MEASURING UNIT AND COORDINATE MEASURING APPARATUS Public/Granted day:2014-04-24
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