Invention Grant
- Patent Title: Socket and electronic device test apparatus
- Patent Title (中): 插座和电子设备测试仪器
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Application No.: US14618070Application Date: 2015-02-10
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Publication No.: US09250263B2Publication Date: 2016-02-02
- Inventor: Kiyoto Nakamura , Takashi Fujisaki
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2011-219943 20111004
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/04 ; G01R31/26 ; G01R1/073 ; G01R31/28

Abstract:
A socket is electrically connected to a test carrier. The test carrier includes a film-shaped first member on which at least one internal terminal, which contacts at least one electrode of an electronic device, is provided; and at least one external terminal which is electrically connected to the internal terminal. The socket includes: at least one contactor which contacts the external terminal; and a first pusher which pushes a portion of the first member where the internal terminal is provided and a portion of the first member surrounding the internal terminal. The first pusher includes: a bag member which has a sealed space within the bag member; and a fluid which is housed in the sealed space.
Public/Granted literature
- US20150153388A1 SOCKET AND ELECTRONIC DEVICE TEST APPARATUS Public/Granted day:2015-06-04
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