Invention Grant
- Patent Title: Via structure, memory array structure, three-dimensional resistance memory and method of forming the same
- Patent Title (中): 通孔结构,存储阵列结构,三维电阻记忆及其形成方法
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Application No.: US14488300Application Date: 2014-09-17
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Publication No.: US09257641B2Publication Date: 2016-02-09
- Inventor: Frederick T. Chen , Tai-Yuan Wu , Yu-Sheng Chen , Wei-Su Chen , Pei-Yi Gu , Yu-De Lin
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L27/24

Abstract:
Provided is a three-dimensional resistance memory including a stack of layers. The stack of layers is encapsulated in a dielectric layer and is adjacent to at least one opening in the encapsulating dielectric layer. At least one L-shaped variable resistance spacer is disposed on at least a portion of the sidewall of the opening adjacent to the stack of layers. An electrode layer fills the remaining portion of the opening.
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