Invention Grant
- Patent Title: Device and method for impedance analysis
- Patent Title (中): 用于阻抗分析的装置和方法
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Application No.: US14092759Application Date: 2013-11-27
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Publication No.: US09261566B2Publication Date: 2016-02-16
- Inventor: Cihun-Siyong Gong , Yi-Feng Luo , Li-Ren Huang , Kai-Cheung Juang
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW102129574U 20130816
- Main IPC: G01R31/36
- IPC: G01R31/36 ; G01N27/02 ; A61B5/053 ; A61B5/01

Abstract:
An impedance analysis device adapted to an object under test (OUT) includes a signal generator, a signal analysis unit and a processing unit. The signal generator outputs a pulse signal to the OUT. The signal analysis unit acquires a response signal which the OUT responds to the pulse signal, and analyzes the response signal to obtain an analysis parameter. The processing unit coupled to the signal analysis unit receives the analysis parameter, so as to obtain an impedance variation characteristic of the OUT.
Public/Granted literature
- US20150048853A1 Device and Method for Impedance Analysis Public/Granted day:2015-02-19
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