Invention Grant
- Patent Title: Three-dimensional shape measurement system and software for controlling the same
- Patent Title (中): 三维形状测量系统及其控制软件
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Application No.: US14303261Application Date: 2014-06-12
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Publication No.: US09267780B2Publication Date: 2016-02-23
- Inventor: Shinsaku Abe
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kawasaki
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki
- Agency: Oliff PLC
- Priority: JP2013-135571 20130627
- Main IPC: G01B5/008
- IPC: G01B5/008 ; G01B5/207 ; G01B11/245

Abstract:
A three-dimensional shape measurement system includes a three-dimensional shape measuring machine that outputs spatial coordinate data on a probe for measuring a work, and a control PC that processes the spatial coordinate data. The three-dimensional shape measurement machine includes a plurality of articulated-armed three-dimensional shape measuring machines that are arranged so that measurement ranges of the probes overlap each other to allow measurement of part or all of the work, and configured such that each can output spatial coordinate data. The control PC includes a coordinate data pool that retains the spatial coordinate data in an identifiable manner with respect to each of the three-dimensional shape measuring machines, and a synthesis unit that synthesizes the spatial coordinate data retained in the coordinate data pool.
Public/Granted literature
- US20150000148A1 THREE-DIMENSIONAL SHAPE MEASUREMENT SYSTEM AND SOFTWARE FOR CONTROLLING THE SAME Public/Granted day:2015-01-01
Information query