Invention Grant
- Patent Title: Drift mitigation for multi-bits phase change memory
- Patent Title (中): 用于多位相变存储器的漂移减轻
-
Application No.: US14507144Application Date: 2014-10-06
-
Publication No.: US09269435B2Publication Date: 2016-02-23
- Inventor: Chung H. Lam , Jing Li
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G11C11/56

Abstract:
An RC-based sensing method and computer program product to effectively sense the cell resistance of a programmed Phase Change Material (PCM) memory cell. The sensing method ensures the same physical configuration of each cell (after programming): same amorphous volume, same trap density/distribution, etc. The sensing method is based on a metric: the RC based sense amplifier implements two trigger points. The measured time interval between these two points is used as the metric to determine whether the programmed cell state, e.g., resistance, is programmed into desired value. The RC-based sensing method is embedded into an iterative PCM cell programming technique to ensure a tight distribution of resistance at each level after programming; and ensure the probability of level aliasing is very small, leading to less problematic drift.
Public/Granted literature
- US20150023094A1 DRIFT MITIGATION FOR MULTI-BITS PHASE CHANGE MEMORY Public/Granted day:2015-01-22
Information query