Invention Grant
- Patent Title: Controller to detect malfunctioning address of memory device
- Patent Title (中): 控制器检测存储设备的故障地址
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Application No.: US14840989Application Date: 2015-08-31
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Publication No.: US09269460B2Publication Date: 2016-02-23
- Inventor: Adrian E. Ong , Fan Ho
- Applicant: RAMBUS INC.
- Applicant Address: US CA Sunnyvale
- Assignee: Rambus Inc.
- Current Assignee: Rambus Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/04

Abstract:
A controller includes a memory test logic circuit to detect a malfunctioning row of primary data storage elements within an external memory device, an internal memory to store an address corresponding to the malfunctioning row of the external memory device, and a memory setup logic circuit to initiate a repair mode in the external memory device and to end the repair mode in the external memory device. The controller further includes a port to couple to an address line to transmit the address corresponding to the malfunctioning row of the external memory device.
Public/Granted literature
- US20150371722A1 CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE Public/Granted day:2015-12-24
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