Invention Grant
US09269460B2 Controller to detect malfunctioning address of memory device 有权
控制器检测存储设备的故障地址

Controller to detect malfunctioning address of memory device
Abstract:
A controller includes a memory test logic circuit to detect a malfunctioning row of primary data storage elements within an external memory device, an internal memory to store an address corresponding to the malfunctioning row of the external memory device, and a memory setup logic circuit to initiate a repair mode in the external memory device and to end the repair mode in the external memory device. The controller further includes a port to couple to an address line to transmit the address corresponding to the malfunctioning row of the external memory device.
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