Technologies are described herein for utilizing a head heater to test temperature stability of a head of a storage device and to prevent the head from operating in an unstable temperature condition. A temperature condition of a read/write head in a storage device is ascertained and it is determined whether the temperature condition is within a predetermined range of temperature conditions in which the read/write head exhibits instability. If the temperature condition of the read/write head is within the predetermined range, a power level of a head heater of the read/write head is adjusted to change the temperature condition of the read/write head to be outside of the predetermined range.