Invention Grant
US09276674B2 Estimating phase using test phases and interpolation for modulation formats using multiple sub-carriers
有权
使用测试阶段估计相位和使用多个子载波的调制格式的内插
- Patent Title: Estimating phase using test phases and interpolation for modulation formats using multiple sub-carriers
- Patent Title (中): 使用测试阶段估计相位和使用多个子载波的调制格式的内插
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Application No.: US14231379Application Date: 2014-03-31
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Publication No.: US09276674B2Publication Date: 2016-03-01
- Inventor: Han H. Sun , Sandy Thomson , Yuejian Wu , Kuang-Tsan Wu
- Applicant: Infinera Corporation
- Applicant Address: US CA Sunnyvale
- Assignee: Infinera Corporation
- Current Assignee: Infinera Corporation
- Current Assignee Address: US CA Sunnyvale
- Agency: Harrity & Harrity LLP
- Agent David L. Soltz
- Main IPC: H04L1/00
- IPC: H04L1/00 ; H04B10/077 ; H04L27/22 ; H04L7/00 ; H04L27/00

Abstract:
An optical receiver may receive input signals carried by sub-carriers, and may apply test phases to each input signal. The optical receiver may determine error values, associated with test phases, for each input signal. The optical receiver may calculate updated metric values, associated with the test phases, for a particular input signal, based on a first error value and a second error value. The first error value may be associated with a first sub-carrier, and the second error value may be associated with a second sub-carrier. The optical receiver may compare the updated metric values associated with the particular input signal, and may determine a test phase that represents an estimated phase, associated with the particular input signal, based on the comparison. The optical receiver may determine a phase estimate value based on the test phase, and may provide the phase estimate value to modify the particular input signal.
Public/Granted literature
- US20150280814A1 ESTIMATING PHASE USING TEST PHASES AND INTERPOLATION FOR MODULATION FORMATS USING MULTIPLE SUB-CARRIERS Public/Granted day:2015-10-01
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