Invention Grant
- Patent Title: Method for preparing thin samples for TEM imaging
- Patent Title (中): TEM成像薄样品的制备方法
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Application No.: US14514199Application Date: 2014-10-14
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Publication No.: US09279752B2Publication Date: 2016-03-08
- Inventor: Michael Moriarty , Stacey Stone , Jeffrey Blackwood
- Applicant: FEI Company
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, PC
- Agent Michael O. Scheinberg; John B. Kelly
- Main IPC: H01J37/00
- IPC: H01J37/00 ; G01N1/32 ; G01N1/28 ; H01J37/305 ; H01L21/02 ; H01J37/02

Abstract:
A method and apparatus for preparing thin TEM samples in a manner that reduces or prevents bending and curtaining is realized. Embodiments of the present invention deposit material onto the face of a TEM sample during the process of preparing the sample. In some embodiments, the material can be deposited on a sample face that has already been thinned before the opposite face is thinned, which can serve to reinforce the structural integrity of the sample and refill areas that have been over-thinned due to a curtaining phenomena. In other embodiments, material can also be deposited onto the face being milled, which can serve to reduce or eliminate curtaining on the sample face.
Public/Granted literature
- US20150102009A1 METHOD FOR PREPARING THIN SAMPLES FOR TEM IMAGING Public/Granted day:2015-04-16
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