Invention Grant
US09281044B2 Apparatuses having a ferroelectric field-effect transistor memory array and related method
有权
具有铁电场效应晶体管存储器阵列和相关方法的装置
- Patent Title: Apparatuses having a ferroelectric field-effect transistor memory array and related method
- Patent Title (中): 具有铁电场效应晶体管存储器阵列和相关方法的装置
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Application No.: US13897037Application Date: 2013-05-17
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Publication No.: US09281044B2Publication Date: 2016-03-08
- Inventor: D. V. Nirmal Ramaswamy , Adam D. Johnson
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
An apparatus comprises field-effect transistor (FET) structures stacked horizontally and vertically in a three-dimensional memory array architecture, gates extending vertically and spaced horizontally between the plurality of FET structures, and a ferroelectric material separating the FET structures and the gates. Individual ferroelectric FETs (FeFETs) are formed at intersections of the FET structures, the gates, and the ferroelectric material. Another apparatus comprises a plurality of bit lines and word lines. Each bit line has at least two sides that are coupled with a ferroelectric material such that each bit line is shared by neighboring gates to faun a plurality of FeFETs. A method of operating a memory array comprises applying a combination of voltages to a plurality of word lines and digit lines for a desired operation for a plurality of FeFET memory cells, at least one digit line having plurality of FeFET memory cells accessible by neighboring gates.
Public/Granted literature
- US20140340952A1 APPARATUSES HAVING A FERROELECTRIC FIELD-EFFECT TRANSISTOR MEMORY ARRAY AND RELATED METHOD Public/Granted day:2014-11-20
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