Invention Grant
- Patent Title: Atomic layer deposition of metal-oxide tunnel barriers using optimized oxidants
-
Application No.: US14138656Application Date: 2013-12-23
-
Publication No.: US09281463B2Publication Date: 2016-03-08
- Inventor: Frank Greer , Andy Steinbach
- Applicant: Intermolecular Inc.
- Applicant Address: US CA San Jose
- Assignee: Intermolecular, Inc.
- Current Assignee: Intermolecular, Inc.
- Current Assignee Address: US CA San Jose
- Main IPC: H01L39/24
- IPC: H01L39/24

Abstract:
Metal oxide tunnel barrier layers for superconducting tunnel junctions are formed by atomic layer deposition. Both precursors include a metal (which may be the same metal or may be different). The first precursor is a metal alkoxide with oxygen bonded to the metal, and the second precursor is an oxygen-free metal precursor with an alkyl-reactive ligand such as a halogen or methyl group. The alkyl-reactive ligand reacts with the alkyl group of the alkoxide, forming a detached by-product and leaving a metal oxide monolayer. The temperature is selected to promote the reaction without causing the metal alkoxide to self-decompose. The oxygen in the alkoxide precursor is bonded to a metal before entering the chamber and remains bonded throughout the reaction that forms the monolayer. Therefore, the oxygen used in this process has no opportunity to oxidize the underlying superconducting electrode.
Public/Granted literature
- US20150179917A1 Atomic layer deposition of metal-oxide tunnel barriers using optimized oxidants Public/Granted day:2015-06-25
Information query
IPC分类: