Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
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Application No.: US14571993Application Date: 2014-12-16
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Publication No.: US09287410B2Publication Date: 2016-03-15
- Inventor: Shinya Sasagawa , Motomu Kurata , Kazuya Hanaoka , Yoshiyuki Kobayashi , Daisuke Matsubayashi
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2013-261600 20131218
- Main IPC: H01L27/04
- IPC: H01L27/04 ; H01L29/786 ; H01L29/04

Abstract:
A semiconductor device with favorable electrical characteristics is provided. The semiconductor device includes an insulating layer, a semiconductor layer over the insulating layer, a source electrode layer and a drain electrode layer electrically connected to the semiconductor layer, a gate insulating film over the semiconductor layer, the source electrode layer, and the drain electrode layer, and a gate electrode layer overlapping with part of the semiconductor layer, part of the source electrode layer, and part of the drain electrode layer with the gate insulating film therebetween. A cross section of the semiconductor layer in the channel width direction is substantially triangular or substantially trapezoidal. The effective channel width is shorter than that for a rectangular cross section.
Public/Granted literature
- US20150171222A1 SEMICONDUCTOR DEVICE Public/Granted day:2015-06-18
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