Invention Grant
- Patent Title: Resistance variable memory cell structures and methods
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Application No.: US14035232Application Date: 2013-09-24
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Publication No.: US09287502B2Publication Date: 2016-03-15
- Inventor: Eugene P Marsh , Timothy A. Quick
- Applicant: Micron Technology, Inc
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: H01L21/20
- IPC: H01L21/20 ; H01L45/00 ; H01L27/10

Abstract:
Resistance variable memory cell structures and methods are described herein. One or more resistance variable memory cell structures include a first electrode common to a first and a second resistance variable memory cell, a first vertically oriented resistance variable material having an arcuate top surface in contact with a second electrode and a non-arcuate bottom surface in contact with the first electrode; and a second vertically oriented resistance variable material having an arcuate top surface in contact with a third electrode and a non-arcuate bottom surface in contact with the first electrode.
Public/Granted literature
- US20140021437A1 RESISTANCE VARIABLE MEMORY CELL STRUCTURES AND METHODS Public/Granted day:2014-01-23
Information query
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