Invention Grant
- Patent Title: Contour measuring apparatus
- Patent Title (中): 轮廓测量仪
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Application No.: US14220883Application Date: 2014-03-20
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Publication No.: US09291442B2Publication Date: 2016-03-22
- Inventor: Hiroyuki Hidaka , Mitsuhisa Nakano , Hideki Kai
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kawasaki-Shi
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki-Shi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2013-062339 20130325
- Main IPC: G01B5/20
- IPC: G01B5/20 ; G01B21/04 ; G01B21/30 ; G01B5/28

Abstract:
A contour measuring apparatus includes: an arm including a stylus in a distal end and being swingable with respect to a cabinet; an attitude change mechanism configured to change an attitude of the arm within a swing range; a stopper configured to make contact with the arm when the arm moves nearer to an installation part of an object to be measured within the swing range; and a controller configured to operate the attitude change mechanism based on a power-off command and return the arm to a mechanical limit position in which the arm makes contact with the stopper.
Public/Granted literature
- US20140283402A1 CONTOUR MEASURING APPARATUS Public/Granted day:2014-09-25
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