Invention Grant
- Patent Title: Hardness tester and program
- Patent Title (中): 硬度计和程序
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Application No.: US13705536Application Date: 2012-12-05
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Publication No.: US09291538B2Publication Date: 2016-03-22
- Inventor: Takeshi Sawa
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2012-001009 20120106
- Main IPC: G01N3/42
- IPC: G01N3/42

Abstract:
The present invention provides a hardness tester capable of accurately detecting a point where an indenter contacts a sample in instrumented indentation testing. Prior to beginning measurement, the hardness tester defines an expected range for a value for a displacement, speed, or acceleration of an indenter during a process of approaching a sample. After measurement has begun, the hardness tester measures the value for the displacement, speed, or acceleration of the indenter during the process of approaching the sample. When the measured value is not within the expected range, the hardness tester determines that detection of a zero point has failed.
Public/Granted literature
- US20130174653A1 HARDNESS TESTER AND PROGRAM Public/Granted day:2013-07-11
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