Invention Grant
- Patent Title: Method and device for processing location information of fault point
- Patent Title (中): 故障点位置信息处理方法及装置
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Application No.: US14081754Application Date: 2013-11-15
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Publication No.: US09294369B2Publication Date: 2016-03-22
- Inventor: Changsheng Sun , Shaojun Fan , Yulin Yuan
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Slater & Matsil, L.L.P.
- Priority: CN201210315421 20120830
- Main IPC: H04L12/703
- IPC: H04L12/703 ; H04L12/26 ; H04L12/723 ; H04L12/24 ; H04L12/437 ; H04L12/707

Abstract:
Embodiments of the present invention provide a method and a device for processing location information of a fault point. The method includes: obtaining, by an ingress node of a tunnel, first location information of a fault point on a link traversed by the tunnel, where the first location information of the fault point includes an identifier of an upstream node of the fault point and an identifier of an interface that is connected to the fault point and located on the upstream node of the fault point; and providing, by the ingress node, the first location information of the fault point to a user so that the user determines a location of the fault point corresponding to a tunnel fault. With the technical solutions of the present invention, the location of the fault point can be determined, and efficiency of troubleshooting specific to the tunnel fault can be improved.
Public/Granted literature
- US20140071835A1 Method and Device for Processing Location Information of Fault Point Public/Granted day:2014-03-13
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