Invention Grant
- Patent Title: Method for measuring interference strength in wireless communication system and device therefor
- Patent Title (中): 无线通信系统干扰强度测量方法及其设备
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Application No.: US14378298Application Date: 2013-03-22
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Publication No.: US09294948B2Publication Date: 2016-03-22
- Inventor: Hyungtae Kim , Kijun Kim
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Lee, Hong, Degerman, Kang & Waimey
- International Application: PCT/KR2013/002405 WO 20130322
- International Announcement: WO2013/141652 WO 20130926
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04B17/345 ; H04B17/318

Abstract:
The present invention relates to a wireless communication system and, more particularly, to a method for enabling a terminal to measure the strength of an interference signal in a wireless communication system and a device therefor, wherein the method comprises the steps of: measuring a first interference strength, which is the strength of an interference signal received from a first base station group; calculating a second interference strength, which is the strength of an interference signal received from a second base station group; and correcting the first interference strength on the basis of the second interference strength.
Public/Granted literature
- US20150017927A1 METHOD FOR MEASURING INTERFERENCE STRENGTH IN WIRELESS COMMUNICATION SYSTEM AND DEVICE THEREFOR Public/Granted day:2015-01-15
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