Invention Grant
- Patent Title: Back-scattering inspection systems and methods for human body
- Patent Title (中): 背散射检查系统和人体的方法
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Application No.: US14138476Application Date: 2013-12-23
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Publication No.: US09295441B2Publication Date: 2016-03-29
- Inventor: Zhiqiang Chen , Ziran Zhao , Yuanjing Li , Wanlong Wu , Yingkang Jin , Li Zhang , Le Tang , Chenguang Zhu , Xianli Ding , Xiuwei Chen , Ming Ruan , Chengcong Xu , Xilei Luo
- Applicant: Nuctech Company Limited
- Applicant Address: CN Haidian District, Beijing CN Haidian District, Beijing
- Assignee: Nuctech Company Limited,Tsinghua University
- Current Assignee: Nuctech Company Limited,Tsinghua University
- Current Assignee Address: CN Haidian District, Beijing CN Haidian District, Beijing
- Agency: Merchant & Gould P.C.
- Priority: CN201210581870 20121227
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G01T1/167 ; G01V5/00

Abstract:
Human body back-scattering inspection systems and methods are disclosed. In the invention, X-rays modulated by the flying-spot forming unit having spirally distributed flying-spots have a distribution having alternating peaks and valleys on the irradiated surface. In this way, scanning starting times can be precisely controlled to cause two devices to have scanning starting times that are different by a half of a cycle. That is, the beams outputted from one device are at maximum when the beams outputted from the other device are at minimum. In other words, even if the ray source of one device emits rays, it will not significantly affect imaging result of the other device. In such way, the two devices may emit rays and perform scanning at the same time, and thus the total scanning time is reduced.
Public/Granted literature
- US20140185770A1 BACK-SCATTERING INSPECTION SYSTEMS AND METHODS FOR HUMAN BODY Public/Granted day:2014-07-03
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