Invention Grant
- Patent Title: Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution in real time
- Patent Title (中): 实时测量相位延迟分布和快轴方位角分布的装置和方法
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Application No.: US14455860Application Date: 2014-08-08
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Publication No.: US09297744B2Publication Date: 2016-03-29
- Inventor: Aijun Zeng , Longhai Liu , Linglin Zhu , Huijie Huang
- Applicant: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Applicant Address: CN Shanghai
- Assignee: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Current Assignee: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Current Assignee Address: CN Shanghai
- Agency: Mei & Mark LLP
- Agent Manni Li
- Priority: CN201210199435 20120615
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01N21/21 ; G01M11/02 ; G01J9/00

Abstract:
Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution of birefringence sample in real time. The device consists of a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter-wave plate, an analyzer array, a charge coupled device (CCD) image sensor and a computer with an image acquisition card. The method can measure the phase retardation distribution and the fast axis azimuth angle distribution of the birefringence sample in real time and has large measurement range. The measurement result is immune to the light-intensity fluctuation of the light source.
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