Invention Grant
US09297772B2 Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
有权
用于在透射小角度X射线散射测量期间放大强度的装置
- Patent Title: Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements
- Patent Title (中): 用于在透射小角度X射线散射测量期间放大强度的装置
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Application No.: US14246702Application Date: 2014-04-07
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Publication No.: US09297772B2Publication Date: 2016-03-29
- Inventor: Wei-En Fu , Wen-Li Wu
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Chutung Township, Hsinchu County
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Chutung Township, Hsinchu County
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: G21K1/00
- IPC: G21K1/00 ; G01N23/201
Abstract:
The disclosure provides an apparatus for amplifying scattering intensity during tSAXS measurements. The apparatus includes an enhancement grating object and a placement mechanism. The enhancement grating object is positioned within a longitudinal coherence length of an incident X-ray from a target object. The placement mechanism is capable of placing the enhancement grating object with nanometer precision with respect to the target object in both a lateral and a longitudinal directions.
Public/Granted literature
- US20150036805A1 APPARATUS FOR AMPLIFYING INTENSITY DURING TRANSMISSION SMALL ANGLE- X-RAY SCATTERING MEASUREMENTS Public/Granted day:2015-02-05
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