Invention Grant
- Patent Title: Methods and apparatus for sensing a memory cell
- Patent Title (中): 用于感测存储器单元的方法和装置
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Application No.: US14886536Application Date: 2015-10-19
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Publication No.: US09299449B2Publication Date: 2016-03-29
- Inventor: Andrea D'Alessandro , Violante Moschiano
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C7/10
- IPC: G11C7/10 ; G11C16/26 ; G11C16/24

Abstract:
Methods of operating a memory include selectively discharging a data line through a memory cell selected for sensing, discharging a sense node to the data line while a voltage level of the sense node is greater than a voltage level of the data line, and inhibiting discharging of the data line to the sense node while the voltage level of the data line is greater than the voltage level of the sense node. Sense circuits include a path between an input node and a sense node facilitating current flow from the sense node to the input node when a voltage level of the sense node is greater than a voltage level of the input node and inhibiting current flow from the input node to the sense node when the voltage level of the sense node is less than the voltage level of the input node.
Public/Granted literature
- US20160042799A1 METHODS AND APPARATUS FOR SENSING A MEMORY CELL Public/Granted day:2016-02-11
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