发明授权
- 专利标题: Sputter neutral particle mass spectrometry apparatus
- 专利标题(中): 溅射中性粒子质谱仪
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申请号: US14640766申请日: 2015-03-06
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公开(公告)号: US09299552B2公开(公告)日: 2016-03-29
- 发明人: Toma Yorisaki
- 申请人: KABUSHIKI KAISHA TOSHIBA
- 申请人地址: JP Minato-ku
- 专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人地址: JP Minato-ku
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P
- 优先权: JP2014-054601 20140318
- 主分类号: H01J49/26
- IPC分类号: H01J49/26 ; H01J49/16 ; H01J49/04 ; H01J49/06
摘要:
A sputter neutral particle mass spectrometry apparatus includes a sample table holding a sample which is a mass spectrometry target, and comprising a temperature control mechanism for the sample, an ion beam irradiation device which irradiates an ion beam on the sample to generate neutral particles, a laser irradiation device which irradiates the neutral particles with a laser to obtain photoexcited ions, a mass spectrometer which draws in the drawn out photoexcited ions and performs mass analysis, a driving system mirror which is provided retractably on a laser light path between the laser irradiation device and the sample table, and reflects the laser when positioned within the laser light path, and, a profiler which is arranged in a reflective direction of the driving system mirror and detects a feature of the laser.
公开/授权文献
- US20150270112A1 SPUTTER NEUTRAL PARTICLE MASS SPECTROMETRY APPARATUS 公开/授权日:2015-09-24
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