Invention Grant
- Patent Title: Raman spectrometry method and Raman spectrometry apparatus
- Patent Title (中): 拉曼光谱法和拉曼光谱仪
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Application No.: US14081294Application Date: 2013-11-15
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Publication No.: US09304086B2Publication Date: 2016-04-05
- Inventor: Masayuki Naya , Shogo Yamazoe
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2011-110410 20110517
- Main IPC: G01N21/65
- IPC: G01N21/65

Abstract:
A surface enhanced Raman spectrometry apparatus is constituted by: a transparent substrate; a metal member that causes surface enhanced Raman scattering to occur, formed on a surface of the transparent substrate; a pressing mechanism that presses a sample placed in contact with the metal member against the metal member; a measuring light irradiating optical system that irradiates a measuring light beam onto the sample through the transparent substrate; and a light detecting section that spectrally detects Raman scattered light, which is generated when the measuring light beam is irradiated onto the sample, through the transparent substrate.
Public/Granted literature
- US20140071447A1 RAMAN SPECTROMETRY METHOD AND RAMAN SPECTROMETRY APPARATUS Public/Granted day:2014-03-13
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