Invention Grant
- Patent Title: Detection and location of electrical connections having a micro-interface abnormality in an electrical system
- Patent Title (中): 在电气系统中具有微接口异常的电连接的检测和定位
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Application No.: US13736214Application Date: 2013-01-08
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Publication No.: US09304159B2Publication Date: 2016-04-05
- Inventor: Xin Zhou , Michael Dadian , Dale Gass , Mark Gould , Edgar Perez Flores , Timothy Thompson
- Applicant: EATON CORPORATION
- Applicant Address: US OH Cleveland
- Assignee: EATON CORPORATION
- Current Assignee: EATON CORPORATION
- Current Assignee Address: US OH Cleveland
- Agency: Eckert Seamans Cherin & Mellott, LLC
- Agent Philip E. Levy; Grant E. Coffield
- Main IPC: G01R31/04
- IPC: G01R31/04 ; G01R27/00 ; G01R31/327 ; G01R31/12 ; G01R31/00 ; G01R31/08

Abstract:
A method of detecting and locating a micro-interface abnormality within an electrical system having a plurality of conductors and a plurality of electrical connections includes identifying a subset of the plurality of electrical connections by detecting an acoustic signal within the electrical system and analyzing the detected acoustic signal and determining that the detected acoustic signal is indicative of an electrical fault, measuring a contact resistance of each of the subset of the plurality of electrical connections, and identifying at least one of the subset of the plurality of electrical connection points as having a micro-interface abnormality based on the measured contact resistances.
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