Invention Grant
- Patent Title: System and method for image based inspection of an object
- Patent Title (中): 一种对物体进行图像检测的系统和方法
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Application No.: US14260624Application Date: 2014-04-24
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Publication No.: US09305345B2Publication Date: 2016-04-05
- Inventor: Ser Nam Lim , Jose Abiel Garza , David Scott Diwinsky , Li Guan , Shubao Liu , Xingwei Yang , Jens Rittscher
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent John P. Darling
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06T17/00 ; G06K9/52 ; H04N17/00 ; G01N21/88

Abstract:
A method for image based inspection of an object includes receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision. The method further includes projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature and an existing measurement feature on the 3D model; and sending a notification including the difference between the projected measurement feature and the existing measurement feature.
Public/Granted literature
- US20150310604A1 SYSTEM AND METHOD FOR IMAGE BASED INSPECTION OF AN OBJECT Public/Granted day:2015-10-29
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