Invention Grant
- Patent Title: Multi-sensor media defect scan
- Patent Title (中): 多传感器介质缺陷扫描
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Application No.: US14228749Application Date: 2014-03-28
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Publication No.: US09305596B2Publication Date: 2016-04-05
- Inventor: Jon David Trantham , William M. Radich , Jason Gadbois , Barmeshwar Vikramaditya
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Hall Estill Attorneys at Law
- Main IPC: G11B27/36
- IPC: G11B27/36 ; G11B20/18 ; G11B5/00 ; G11B5/09 ; G11B5/60

Abstract:
Apparatus and method for detecting media defects using a multi-sensor transducer. In some embodiments, a first pattern is written to a first track on a rotatable storage media and a second pattern is written to a second track on the media. A first read sensor of a multi-sensor transducer senses the first pattern from the first track and a second read sensor of the multi-sensor transducer concurrently senses the second pattern from the second track. At least one storage media defect is detected responsive to the sensed first and second patterns.
Public/Granted literature
- US20150279419A1 MULTI-SENSOR MEDIA DEFECT SCAN Public/Granted day:2015-10-01
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