发明授权
- 专利标题: Impedance matching apparatus and impedance matching method
- 专利标题(中): 阻抗匹配装置和阻抗匹配方法
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申请号: US14235661申请日: 2012-07-20
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公开(公告)号: US09306534B2公开(公告)日: 2016-04-05
- 发明人: Won Suk Chung
- 申请人: Won Suk Chung
- 申请人地址: KR Seoul
- 专利权人: LG INNOTEK CO., LTD.
- 当前专利权人: LG INNOTEK CO., LTD.
- 当前专利权人地址: KR Seoul
- 代理机构: Saliwanchik, Lloyd & Eisenschenk
- 优先权: KR10-2011-0075472 20110728
- 国际申请: PCT/KR2012/005805 WO 20120720
- 国际公布: WO2013/015572 WO 20130131
- 主分类号: H04B1/04
- IPC分类号: H04B1/04 ; H03H7/40 ; H04B17/10 ; H04B1/403 ; H04B1/00 ; H03H7/38
摘要:
Disclosed are an impedance matching apparatus and an impedance matching method thereof. The impedance matching apparatus performs impedance matching between a front end module and an antenna. The impedance matching apparatus includes a switching unit to selectively select multiple-band RF input signals, a power amplifying unit to amplify the RF input signal selected from the switching unit, a reflected power measuring unit to measure a reflection coefficient for the RF input signal, a matching unit to adjust a variable device so that the reflection coefficient is minimized, and a controller to provide a variable device value allowing the minimum reflection coefficient based on the amplified RF input signal and the reflection coefficient.
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