Invention Grant
- Patent Title: Apparatus for acquiring information from object to be measured and aquiring method therefor
- Patent Title (中): 用于从要测量的对象获取信息的装置及其方法
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Application No.: US14161509Application Date: 2014-01-22
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Publication No.: US09310254B2Publication Date: 2016-04-12
- Inventor: Takeaki Itsuji
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2013-012174 20130125
- Main IPC: G01J5/10
- IPC: G01J5/10 ; G01J3/42 ; G01J5/08 ; G01N21/03 ; G01N21/3586

Abstract:
An apparatus configured to acquire information on an object to be measured by an electromagnetic wave pulse, the apparatus includes: a generating unit configured to generate the electromagnetic wave pulse with which the object to be measured is irradiated; a detecting unit configured to detect the electromagnetic wave pulse from the object to be measured; a casing including at least a part of a propagation path of the electromagnetic wave pulse leading from the generating unit to the detecting unit; and a measuring window unit configured to change a propagation distance of the electromagnetic wave pulse by moving a measuring window disposed in a part of the casing. The object to be measured is disposed on an opposite side of the propagation path of the electromagnetic wave pulse inside the casing by interposing the measuring window.
Public/Granted literature
- US20140209802A1 APPARATUS FOR ACQUIRING INFORMATION FROM OBJECT TO BE MEASURED AND AQUIRING METHOD THEREFOR Public/Granted day:2014-07-31
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