A processing device can identify gates of an integrated circuit design having a slack value less than a predefined slack threshold. The processing device can further, for each of the identified gates, determine (i) a number of nodes of the integrated circuit design that experience a timing slack improvement if the gate is swapped with an alternative implementation having a reduced delay or (ii) a sum of timing slack improvements experienced by nodes of the integrated circuit design if the gate is swapped with the alternative implementation having a reduced delay. The processing device can still further swap the gate with the alternative implementation having the reduced delay if the determined number or sum is greater than a corresponding predetermined threshold.