Invention Grant
US09322878B2 Semiconductor device, physical quantity sensor, electronic apparatus, and moving object 有权
半导体器件,物理量传感器,电子设备和移动物体

Semiconductor device, physical quantity sensor, electronic apparatus, and moving object
Abstract:
A semiconductor device includes a digital circuit having a scan test mode. The digital circuit includes a first flip-flop forming a part of a scan chain when in the scan test mode, and a first selector provided on an input side of the first flip-flop. The first selector is capable of selecting a first signal when not in the scan test mode, and selecting a second signal that is different from the first signal when in the scan test mode.
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