Invention Grant
- Patent Title: Open angle detection and processing apparatus and method
- Patent Title (中): 开角检测处理装置及方法
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Application No.: US13993664Application Date: 2012-12-27
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Publication No.: US09324303B2Publication Date: 2016-04-26
- Inventor: Liwei Ma , Jiqiang Song , Gansha Wu , Zhuo Wang
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- International Application: PCT/CN2012/087633 WO 20121227
- International Announcement: WO2014/101036 WO 20140703
- Main IPC: G06F3/033
- IPC: G06F3/033 ; G09G5/37 ; G06F3/0346 ; G06F3/0354 ; G06F3/14 ; G06F1/16

Abstract:
Embodiments of techniques and apparatus for open angle detection and processing are described. In embodiments, an apparatus may comprise a first panel having a display, a second panel movably coupled with the first panel. The first and second panels variably define an angle between these two panels. One or more sensors may be disposed in the apparatus and configured to detect an angle change event of the variable angle between two panels. The angle changing information may be used by an application to vary output of the application onto the display. Other embodiments may be described and claimed.
Public/Granted literature
- US20140184489A1 OPEN ANGLE DETECTION AND PROCESSING APPARATUS AND METHOD Public/Granted day:2014-07-03
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