Invention Grant
US09326731B2 Method of measuring an artefact removed photoplethysmographic (PPG) signal and a measurement system
有权
测量人造物去除的光电体积描记术（PPG）信号和测量系统的方法
- Patent Title: Method of measuring an artefact removed photoplethysmographic (PPG) signal and a measurement system
- Patent Title (中): 测量人造物去除的光电体积描记术（PPG）信号和测量系统的方法
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Application No.: US14006265Application Date: 2012-03-26
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Publication No.: US09326731B2Publication Date: 2016-05-03
- Inventor: Nyan Myo Naing , Md Irwan Bin Md Kassim , Mohamad Sulhede Bin Samsudin , Visit Thaveeprungsriporn
- Applicant: Nyan Myo Naing , Md Irwan Bin Md Kassim , Mohamad Sulhede Bin Samsudin , Visit Thaveeprungsriporn
- Applicant Address: JP
- Assignee: NITTO DENKO CORPORATION
- Current Assignee: NITTO DENKO CORPORATION
- Current Assignee Address: JP
- Agency: Volpe and Koenig, P.C.
- Priority: SG201102122 20110325
- International Application: PCT/SG2012/000104 WO 20120326
- International Announcement: WO2012/134395 WO 20121004
- Main IPC: A61B5/1455
- IPC: A61B5/1455 ; A61B5/00 ; A61B5/024 ; A61B5/0295 ; A61B5/026
Abstract:
A method of measuring an artifact removed photoplethysmographic (PPG) signal and a measurement system for measuring an artifact removed photoplethysmographic (PPG) signal are provided. The method comprises obtaining a first set of PPG signals from a plurality of detectors at respective measurement sites using a first illumination; obtaining a second set of PPG signals from the plurality of detectors using a second illumination; obtaining at least two pairs of PPG signals, each pair comprising one PPG signal from the first set and one PPG signal from the second set, and for each pair, computing an artifact reference signal to obtain a candidate PPG signal; and choosing one of the candidate PPG signals as the artifact removed PPG signal.
Public/Granted literature
- US20140058272A1 METHOD OF MEASURING AN ARTEFACT REMOVED PHOTOPLETHYSMOGRAPHIC (PPG) SIGNAL AND A MEASUREMENT SYSTEM Public/Granted day:2014-02-27
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