发明授权
US09329225B2 Testing device, test system including the same, and method thereof
有权
测试装置，包括其的测试系统及其方法
- 专利标题： Testing device, test system including the same, and method thereof
- 专利标题（中）： 测试装置，包括其的测试系统及其方法
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申请号： US13310116申请日： 2011-12-02
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公开(公告)号： US09329225B2公开(公告)日： 2016-05-03
- 发明人: Yun-Cheol Kim , Chang-Ho Lee , Jin-Ho Choi , Min-Woo Kim
- 申请人： Yun-Cheol Kim , Chang-Ho Lee , Jin-Ho Choi , Min-Woo Kim
- 申请人地址： KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址： KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 代理机构： Muir Patent Law, PLLC
- 优先权： KR10-2010-0126151 20101210
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
A testing device includes a signal sensing unit and a signal processing unit. The signal sensing unit generates a test output signal by sensing a signal from a device under test including a plurality of passive elements that are connected in parallel. The signal processing unit detects an open-type fault of the plurality of passive elements by measuring an impedance of the device under test based on element characteristic information of the plurality of passive elements.