Invention Grant
- Patent Title: Unit testing and analysis of multiple UUTs
- Patent Title (中): 单元测试和分析多个UUT
-
Application No.: US14630923Application Date: 2015-02-25
-
Publication No.: US09332450B2Publication Date: 2016-05-03
- Inventor: Craig E. Rupp , Gerardo Orozco Valdes , I. Zakir Ahmed , Vijaya Yajnanarayana
- Applicant: NATIONAL INSTRUMENTS CORPORATION
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Brian E. Moore
- Main IPC: G06F11/26
- IPC: G06F11/26 ; H04W24/08

Abstract:
Method and system for a test process. The method may include performing tests on one or more units under test (UUTs). At least one test on one or more UUTs may be performed. A signal may be acquired from the UUT. A reference signal may be retrieved. The reference signal may be derived from a transmitted signal characteristic of the UUT. The signal may be analyzed with respect to the reference signal. Results, useable to characterize the one or more UUTs, from performing the at least one test on the one or more UUTs may be stored. The reference signal may be derived from an initial test and may be stored for subsequent retrieval. A respective reference signal may be retrieved for all UUTs of the one or more UUTs for a respective test. The signal may be a radio frequency signal. The UUT may be a wireless mobile device.
Public/Granted literature
- US20150172943A1 Unit Testing and Analysis of Multiple UUTs Public/Granted day:2015-06-18
Information query