Invention Grant
- Patent Title: Dual waveband temperature detector
- Patent Title (中): 双波段温度检测器
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Application No.: US13351882Application Date: 2012-01-17
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Publication No.: US09335219B2Publication Date: 2016-05-10
- Inventor: Alexander Stein , Francesco Pompei
- Applicant: Alexander Stein , Francesco Pompei
- Applicant Address: US MA Watertown
- Assignee: Exergen Corporation
- Current Assignee: Exergen Corporation
- Current Assignee Address: US MA Watertown
- Agency: Hamilton, Brook, Smith & Reynolds, P.C.
- Main IPC: G01K7/00
- IPC: G01K7/00 ; G01J5/60

Abstract:
There are many industrial applications in which non-contact temperature sensing is useful for increasing production speed and quality, such as printing, laminating, extrusion, and metal forming. Disclosed is a non-contact temperature determining apparatus which uses two wide wavelength bands integrating sensors to determine the radiance ratio of a target and thereby determine a corresponding temperature of the target. Also disclosed is a non-contact temperature determining apparatus in which a beam splitter passes one wide wavelength band to a sensor and reflects another distinct wide wavelength band to another sensor from which temperature can be determined. A disclosed embodiment of the dual waveband temperature detector improves upon traditional and currently available ratio pyrometers by further reducing the cost of the system, making installation and use easier, and improving temperature detection for low temperature industrial applications.
Public/Granted literature
- US20120183013A1 DUAL WAVEBAND TEMPERATURE DETECTOR Public/Granted day:2012-07-19
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