Invention Grant
- Patent Title: Probe approach for DGS sizing
- Patent Title (中): DGS尺寸检测方法
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Application No.: US13706531Application Date: 2012-12-06
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Publication No.: US09335302B2Publication Date: 2016-05-10
- Inventor: York Oberdoerfer , Roman Heinrich Koch , Wolf-Dietrich Kleinert
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Cooper Legal Group, LLC
- Main IPC: G01N29/24
- IPC: G01N29/24 ; G01N29/06 ; G01N29/26 ; G01N29/44 ; G01N29/04 ; G01N29/28

Abstract:
An ultrasonic detection assembly detects a characteristic in a test object. The ultrasonic detection assembly includes a phased array probe positioned in proximity to a peripheral surface of the test object. The phased array probe includes a plurality of transducer elements. The transducer elements of the phased array probe transmit a sound beam into the test object. The sound beam is movable by the phased array probe within the test object to detect the characteristic. A method of detecting a characteristic in the test object with the ultrasonic detection assembly is also provided.
Public/Granted literature
- US20140157903A1 PROBE APPROACH FOR DGS SIZING Public/Granted day:2014-06-12
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