Invention Grant
US09335338B2 Automated diagnostic analyzers having rear accessible track systems and related methods
有权
自动诊断分析仪具有后方可及性跟踪系统及相关方法
- Patent Title: Automated diagnostic analyzers having rear accessible track systems and related methods
- Patent Title (中): 自动诊断分析仪具有后方可及性跟踪系统及相关方法
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Application No.: US14213048Application Date: 2014-03-14
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Publication No.: US09335338B2Publication Date: 2016-05-10
- Inventor: Brian L. Ochranek , David C. Arnquist , Takehiko Oonuma , Hirotoshi Tahara , Naoto Sato , Bradley P. Smith
- Applicant: Abbott Laboratories , Toshiba Medical Systems Corporation
- Applicant Address: JP Otawara-shi US IL Abbott Park
- Assignee: Toshiba Medical Systems Corporation,Abbott Laboratories
- Current Assignee: Toshiba Medical Systems Corporation,Abbott Laboratories
- Current Assignee Address: JP Otawara-shi US IL Abbott Park
- Agency: Hanley, Flight & Zimmerman, LLC
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/10 ; G01N33/53 ; G01N33/48 ; G01N35/04

Abstract:
Example apparatus and methods related to automated diagnostic analyzers having rear accessible track systems. An example apparatus disclosed herein includes an analyzer to perform a diagnostic test, the analyzer having a first side and a second side opposite the first side. The example apparatus includes a loading bay disposed on the first side of the analyzer to receive a first carrier and a pipetting mechanism coupled to the analyzer adjacent the second side. The example apparatus also includes a first carrier shuttle to transport the first carrier from a first location adjacent the loading bay to a second location adjacent the pipetting mechanism and a track disposed adjacent the second side of the analyzer to transfer a second carrier to a third location adjacent the pipetting mechanism.
Public/Granted literature
- US20140273242A1 AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS AND RELATED METHODS Public/Granted day:2014-09-18
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