Invention Grant
- Patent Title: Apparatus and method for detecting error
- Patent Title (中): 检测误差的装置和方法
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Application No.: US13890675Application Date: 2013-05-09
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Publication No.: US09336114B2Publication Date: 2016-05-10
- Inventor: Young Sam Shin , Seung Won Lee , Shi Hwa Lee , Min Young Son , Jae Don Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2012-0080405 20120724
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/34 ; G06F11/07

Abstract:
An apparatus and method for detecting an error occurring when an application program is executed in a computer environment is provided. The error detection apparatus may measure a deterministic progress index (DPI) and a program counter (PC) value when an instruction is executed, set, as a verification set, a DPI and a PC value measured when the instruction is executed without causing an error, set, as a measurement set, the DPI and the PC value measured when an instruction is executed, and detect a runtime error of the instruction by comparing the measurement set to the verification set.
Public/Granted literature
- US20140032976A1 APPARATUS AND METHOD FOR DETECTING ERROR Public/Granted day:2014-01-30
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