Invention Grant
- Patent Title: Waveform analyzer and waveform analysis method
- Patent Title (中): 波形分析仪和波形分析方法
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Application No.: US13358776Application Date: 2012-01-26
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Publication No.: US09339205B2Publication Date: 2016-05-17
- Inventor: Yutaka Tamiya , Hiroaki Iwashita , Hiroyuki Higuchi
- Applicant: Yutaka Tamiya , Hiroaki Iwashita , Hiroyuki Higuchi
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2011-060790 20110318
- Main IPC: A61B5/0452
- IPC: A61B5/0452 ; A61B5/0464 ; G06K9/00 ; G01R29/02

Abstract:
A waveform analyzer includes a converter which converts a logical function, where a pair of data including a time and a value at the time is variable, created according to data sets of a time and a value of a signal waveform at the time into a second function expressed by a binary decision diagram, an acquisition unit which obtains for each of characteristic points of a reference waveform a condition representative of constraints on a relationship between time information specified by the points and a value corresponding to the time information in the signal waveform according to a value of the reference waveform at the points and a specified tolerance given to a value of the reference waveform, and a searching unit which applies the condition for each of the points to the second function to obtain a time range which meets the entirety of the conditions.
Public/Granted literature
- US20120239328A1 WAVEFORM ANALYZER AND WAVEFORM ANALYSIS METHOD Public/Granted day:2012-09-20
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