Invention Grant
US09341460B2 Double cone stylus, touch probe, and method of calibrating double cone stylus
有权
双锥触针,触摸探头和校准双锥触针的方法
- Patent Title: Double cone stylus, touch probe, and method of calibrating double cone stylus
- Patent Title (中): 双锥触针,触摸探头和校准双锥触针的方法
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Application No.: US14056321Application Date: 2013-10-17
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Publication No.: US09341460B2Publication Date: 2016-05-17
- Inventor: Masaki Kurihara , Yasuhiro Takahama , Masanori Arai , Tomoyuki Miyazaki
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2012-232407 20121019
- Main IPC: G01B5/016
- IPC: G01B5/016 ; G01B5/012 ; G01B21/04 ; G01B7/012

Abstract:
A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above.
Public/Granted literature
- US20140109420A1 DOUBLE CONE STYLUS, TOUCH PROBE, AND METHOD OF CALIBRATING DOUBLE CONE STYLUS Public/Granted day:2014-04-24
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