Invention Grant
US09341568B2 Refractive index sensor for analyzing an analyte, and method of fabricating thereof
有权
用于分析分析物的折射率传感器及其制造方法
- Patent Title: Refractive index sensor for analyzing an analyte, and method of fabricating thereof
- Patent Title (中): 用于分析分析物的折射率传感器及其制造方法
-
Application No.: US14434319Application Date: 2013-10-08
-
Publication No.: US09341568B2Publication Date: 2016-05-17
- Inventor: Qing Liu , Jack Sheng Kee , Mi Kyoung Park
- Applicant: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH
- Applicant Address: SG Singapore
- Assignee: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH
- Current Assignee: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH
- Current Assignee Address: SG Singapore
- Agency: Conley Rose, P.C.
- Priority: SG201207483-7 20121008
- International Application: PCT/SG2013/000432 WO 20131008
- International Announcement: WO2014/058392 WO 20140417
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G01N21/55 ; G02B6/10

Abstract:
A refractive index sensor is provided for analyzing an analyte, the sensor including: a strip waveguide for receiving an input light signal therein and transmitting the light signal, subject to manipulation as it propagates through the strip waveguide, to a detector for analysis with respect to the analyte; and a slot waveguide for sensing the analyte disposed thereon and for receiving a sensing signal, corresponding to said manipulation of the light signal, from the strip waveguide, wherein a grating is formed on a surface of the strip waveguide to enable coupling of the sensing signal from the strip waveguide to the slot waveguide, and the sensor is configured with enhanced sensitivity based on a sensitivity difference between the slot waveguide and the strip waveguide, and/or a group index difference between the slot waveguide and the strip waveguide.
Public/Granted literature
- US20150268160A1 REFRACTIVE INDEX SENSOR FOR ANALYZING AN ANALYTE, AND METHOD OF FABRICATING THEREOF Public/Granted day:2015-09-24
Information query