发明授权
US09343262B2 Ion implantation apparatus, beam parallelizing apparatus, and ion implantation method
有权
离子注入装置,光束并行化装置和离子注入方法
- 专利标题: Ion implantation apparatus, beam parallelizing apparatus, and ion implantation method
- 专利标题(中): 离子注入装置,光束并行化装置和离子注入方法
-
申请号: US14468844申请日: 2014-08-26
-
公开(公告)号: US09343262B2公开(公告)日: 2016-05-17
- 发明人: Takanori Yagita , Mitsuaki Kabasawa , Haruka Sasaki
- 申请人: Sumitomo Heavy Industries Ion Technology Co., Ltd.
- 申请人地址: JP Tokyo
- 专利权人: Sumitomo Heavy Industries Ion Technology Co., Ltd.
- 当前专利权人: Sumitomo Heavy Industries Ion Technology Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Michael Best & Friedrich LLP
- 优先权: JP2013-177626 20130829
- 主分类号: H01J37/00
- IPC分类号: H01J37/00 ; H01J37/24 ; H01J37/317
摘要:
An ion implantation apparatus includes a beam parallelizing unit and a third power supply unit. The beam parallelizing unit includes an acceleration lens, and a deceleration lens disposed adjacent to the acceleration lens in an ion beam transportation direction. The third power supply unit operates the beam parallelizing unit under one of a plurality of energy settings. The plurality of energy settings includes a first energy setting suitable for transport of a low energy ion, and a second energy setting suitable for transport of a high energy ion beam. The third power supply unit is configured to generate a potential difference in at least the acceleration lens under the second energy setting, and generate a potential difference in at least the deceleration lens under the first energy setting. A curvature of the deceleration lens is smaller than a curvature of the acceleration lens.
公开/授权文献
信息查询