Invention Grant
US09343262B2 Ion implantation apparatus, beam parallelizing apparatus, and ion implantation method
有权
离子注入装置,光束并行化装置和离子注入方法
- Patent Title: Ion implantation apparatus, beam parallelizing apparatus, and ion implantation method
- Patent Title (中): 离子注入装置,光束并行化装置和离子注入方法
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Application No.: US14468844Application Date: 2014-08-26
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Publication No.: US09343262B2Publication Date: 2016-05-17
- Inventor: Takanori Yagita , Mitsuaki Kabasawa , Haruka Sasaki
- Applicant: Sumitomo Heavy Industries Ion Technology Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: Sumitomo Heavy Industries Ion Technology Co., Ltd.
- Current Assignee: Sumitomo Heavy Industries Ion Technology Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Michael Best & Friedrich LLP
- Priority: JP2013-177626 20130829
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/24 ; H01J37/317

Abstract:
An ion implantation apparatus includes a beam parallelizing unit and a third power supply unit. The beam parallelizing unit includes an acceleration lens, and a deceleration lens disposed adjacent to the acceleration lens in an ion beam transportation direction. The third power supply unit operates the beam parallelizing unit under one of a plurality of energy settings. The plurality of energy settings includes a first energy setting suitable for transport of a low energy ion, and a second energy setting suitable for transport of a high energy ion beam. The third power supply unit is configured to generate a potential difference in at least the acceleration lens under the second energy setting, and generate a potential difference in at least the deceleration lens under the first energy setting. A curvature of the deceleration lens is smaller than a curvature of the acceleration lens.
Public/Granted literature
- US20150064888A1 ION IMPLANTATION APPARATUS, BEAM PARALLELIZING APPARATUS, AND ION IMPLANTATION METHOD Public/Granted day:2015-03-05
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