An automated test system for a semiconductor device to concurrently perform multiple device tests is provided. The system may include at least one test client, at least one test site and a test server. The at least one test client is configured to receive a test request of at least one worker and to display a test response. The at least one test site is configured to test at least one device under test (DUT). The test server is configured to communicate with the at least one test client and the at least one test site, divide and/or drive the at least one test site in response to the test request of the at least one test client, and transmit a response of the at least one test site to the at least one test client.