Invention Grant
- Patent Title: Method and apparatus for calculating yield
- Patent Title (中): 计算产量的方法和装置
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Application No.: US13564773Application Date: 2012-08-02
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Publication No.: US09348958B2Publication Date: 2016-05-24
- Inventor: Hiroyuki Higuchi , Yu Liu , Yuzi Kanazawa
- Applicant: Hiroyuki Higuchi , Yu Liu , Yuzi Kanazawa
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2011-177775 20110815
- Main IPC: G06N5/02
- IPC: G06N5/02 ; G06F17/50

Abstract:
A disclosed method includes: converting, for each sample point, a set of performance item values for a sample point into coordinate values of a mesh element containing the set among plural mesh elements obtained by dividing a space mapped by the performance items; generating a binary decision graph representing a group of the coordinate values of the sample points; calculating the number of sample points including second sample points that dominates a first sample point and the first sample point, by counting the number of paths in the binary decision graph from a root node to a leaf node representing “1” through at least one of certain nodes corresponding to coordinate values that are equal to or less than coordinate values of the first sample point; and calculating a yield of the first sample point by dividing the calculated number by the number of the plural sample points.
Public/Granted literature
- US20130046728A1 METHOD AND APPARATUS FOR CALCULATING YIELD Public/Granted day:2013-02-21
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