Invention Grant
US09349568B2 Sample introduction device and charged particle beam instrument 有权
样品引入装置和带电粒子束仪

  • Patent Title: Sample introduction device and charged particle beam instrument
  • Patent Title (中): 样品引入装置和带电粒子束仪
  • Application No.: US14225793
    Application Date: 2014-03-26
  • Publication No.: US09349568B2
    Publication Date: 2016-05-24
  • Inventor: Shuichi Yuasa
  • Applicant: JEOL Ltd.
  • Applicant Address: JP Tokyo
  • Assignee: JEOL Ltd.
  • Current Assignee: JEOL Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: The Webb Law Firm
  • Priority: JP2013-68617 20130328
  • Main IPC: H01J37/18
  • IPC: H01J37/18 H01J37/20 H01J37/16
Sample introduction device and charged particle beam instrument
Abstract:
A sample introduction device (100) is adapted to introduce a sample (S) into the sample chamber (1) of a charged particle beam instrument. The device includes: a pre-evacuation chamber (2) for performing a pre-evacuation; a sample holder (10) having a sample holding portion (12) capable of holding the sample (S); a support portion (20) for supporting the sample holder (10); mechanical drives (30); and goniometer (50) for moving and rotating the support portion (20) such that the sample holding portion (12) moves from inside the pre-evacuation chamber (2) into the sample chamber (1). Partition valve (70) can be activated by the action of the goniometer.
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