Invention Grant
- Patent Title: Sample introduction device and charged particle beam instrument
- Patent Title (中): 样品引入装置和带电粒子束仪
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Application No.: US14225793Application Date: 2014-03-26
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Publication No.: US09349568B2Publication Date: 2016-05-24
- Inventor: Shuichi Yuasa
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2013-68617 20130328
- Main IPC: H01J37/18
- IPC: H01J37/18 ; H01J37/20 ; H01J37/16

Abstract:
A sample introduction device (100) is adapted to introduce a sample (S) into the sample chamber (1) of a charged particle beam instrument. The device includes: a pre-evacuation chamber (2) for performing a pre-evacuation; a sample holder (10) having a sample holding portion (12) capable of holding the sample (S); a support portion (20) for supporting the sample holder (10); mechanical drives (30); and goniometer (50) for moving and rotating the support portion (20) such that the sample holding portion (12) moves from inside the pre-evacuation chamber (2) into the sample chamber (1). Partition valve (70) can be activated by the action of the goniometer.
Public/Granted literature
- US20140290393A1 Sample Introduction Device and Charged Particle Beam Instrument Public/Granted day:2014-10-02
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