Invention Grant
- Patent Title: Subjective eye refracting power measurement apparatus
- Patent Title (中): 主观屈光力测量仪
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Application No.: US14167368Application Date: 2014-01-29
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Publication No.: US09351636B2Publication Date: 2016-05-31
- Inventor: Toshihiro Kobayashi , Yoshinobu Hosoi
- Applicant: NIDEK CO., LTD.
- Applicant Address: JP Aichi
- Assignee: NIDEK CO., LTD.
- Current Assignee: NIDEK CO., LTD.
- Current Assignee Address: JP Aichi
- Agency: Sughrue Mion, PLLC
- Priority: JP2013-016259 20130130; JP2013-016260 20130130
- Main IPC: A61B3/02
- IPC: A61B3/02 ; A61B3/032

Abstract:
There is provided a subjective eye refracting power measurement apparatus which measures a refracting power of a subject eye. The apparatus includes a projection optical system which projects a visual target light flux toward the subject eye to form a visual target on a fundus of the subject eye; a correction optical system which changes a refracting power thereof; a relay optical system which relays a light flux passing through the correction optical system and to form an image of the correction optical system in front of the subject eye; a deviation detector which detects a positional deviation of the image of the correction optical system with respect to the subject eye; and a correction unit which optically corrects a formation position of the image based on a detection result by the deviation detector such that the image is formed in front of the subject eye.
Public/Granted literature
- US20140211165A1 SUBJECTIVE EYE REFRACTING POWER MEASUREMENT APPARATUS Public/Granted day:2014-07-31
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